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VMC++, Electron and Photon Monte Carlo Calculations Optimized for Radiation Treatment Planning

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Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications

Abstract

VMC++ is a package for the class II condensed history Monte Carlo simulation of coupled electron-photon transport optimized for three dimensional dose calculations used in the treatment planning of cancer patients irradiated with photons and/or electrons (RTP). VMC++ is partially based on ideas developed for the VMC and xVMC algorithms but incorporates a variety of improvements in the modelling of the underlying physical processes and simulation geometry. This papers describes a new variance reduction technique, called STOPS, and discusses the use of quasi-random number sequences.

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Author information

Authors and Affiliations

  1. Ionizing Radiation Standards, NRC, Ottawa, Canada

    I. Kawrakow

Authors
  1. I. Kawrakow
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Editor information

Editors and Affiliations

  1. Instituto Tecnológico e Nuclear, Estrada Nacional no. 10, 2686-953, Sacavém, Portugal

    Andreas Kling

  2. Laboratório de Instrumentação e Partículas, Av. Elias Garcia, 14-1° Rovisco Pais, 1000-149, Lisboa, Portugal

    Fernando J. C. Baräo

  3. Department of Nuclear Energy System, JAERI, Tokai-mura, Naka-gun, 319-1195, Ibaraki-ken, Japan

    Masayuki Nakagawa

  4. Departamento da Física, Universidade de Coimbra, 3004-516, Coimbra, Portugal

    Luis Távora

  5. Departamento de Física, IST, AV. Rovisco Pais, 1049-001, Lisboa, Portugal

    Pedro Vaz

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© 2001 Springer-Verlag Berlin Heidelberg

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Kawrakow, I. (2001). VMC++, Electron and Photon Monte Carlo Calculations Optimized for Radiation Treatment Planning. In: Kling, A., Baräo, F.J.C., Nakagawa, M., Távora, L., Vaz, P. (eds) Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-18211-2_38

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  • DOI: https://doi.org/10.1007/978-3-642-18211-2_38

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-62113-0

  • Online ISBN: 978-3-642-18211-2

  • eBook Packages: Springer Book Archive

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