Erschienen in:
01.03.2015 | Interventional
Short-term and long-term outcome of radiological-guided insertion of central venous access port devices implanted at the forearm: a retrospective monocenter analysis in 1704 patients
verfasst von:
Moritz Wildgruber, Sebastian Borgmeyer, Bernhard Haller, Heike Jansen, Jochen Gaa, Marion Kiechle, Reinhard Meier, Johannes Ettl, Hermann Berger
Erschienen in:
European Radiology
|
Ausgabe 3/2015
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Abstract
Objectives
The objectives are to analyze the technical success rate as well as the short-term and long-term complications of totally implantable venous access ports (TIVAPs) at the forearm.
Methods
Retrospective analysis of 1,704 consecutively implanted TIVAPs was performed. Primary endpoints were defined as technical success rate, clinical outcome, device service interval, and rates of major complications. Minor complications not requiring port explantation were defined as secondary endpoints.
Results
The technical success rate was 99.2 % with no major complications. During follow-up, a total of 643,200 catheter-days were documented, the mean device service interval was 380.6 days/patient. A total of 243 complications (14.4 %) in 226 patients were observed (0.4/1000 catheter-days), in 140 patients (8.3 %) the port device had to be explanted. Disconnection between the port device and the catheter (1.6 %) was more frequent than fracture (0.8 %) and leakage (0.6 %) of the catheter, which occurred more frequently when the catheter was inserted via the cephalic versus the brachial vein.
Conclusion
TIVAP implantation at the forearm is a simple and safe procedure with a low rate of early and late complications.
Key Points
• TIVAP implantation at the forearm is a minimally invasive and safe procedure.
• Technical success rate is close to 100 %.
• Short-term and long-term complication rates are low.